© lmn - 2005workshop nano – ar - 2 martie 2006 contributia laboratorului de metode numerice din...
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© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Contributia Laboratorului de Metode Numerice din UPB la dezvoltarea
Platformei Tehnologice Europene de Nanoelectronica
Metodogii si instrumente pentru proiectarea nano-electronica automata - nEDA
Daniel IOAN, Gabriela CIOPRINA
“Politehnica” University of Bucharest -CIEAC/LMN
Numerical Methods Laboratoryhttp://www.lmn.pub.ro
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Predictia ITRS nanoelectronica
90
65
45
32
22 189.3
15
234.2
40
53
0
10
20
30
40
50
60
70
80
90
100
2002 2004 2006 2008 2010 2012 2014 2016 2018 2020
semipitch[nm]
frequency[GHz]
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Agenda Cercetarilor Strategice a platformei tehnologice ENIAC
1960 1980 2000 2020 2040 2060
10μm
1μm
100nm
10nm
1nm
More than Moore
More Moore RF, HV, MS
Beyond CMOS
http://www.cordis.lu/ist/eniac/
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Principiile Strategiei - Viziunea LMN pentru 2010
Areas
Activities
Sectors
Attractiveness of EU science
Competitive-ness of EU
Culture of excellence
Training
Innovation
Research
Activities
Simulation
Theory
Experiment
Prof.Assoc.
Academic
Industry
Sectors
For details see http://www.lmn.pub/~daniel/strategieLMN2010
MethodsMethods
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Piramida interdisciplinaritatii
Mathematics
Computer Sci, IT
Sciences
AreasAppl. Math.
Computing
Eng. Sci.
CSENumericalMethods
HPC
El.Eng.
SCEE
EDA
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Proiecte de cercetare si educationale, nationale si internationale ale LMN
• FP5/IST/CODESTAR - Compact modeling of on-chip passive structures at high frequency (the etalon research project !)
• FP6/IST/CHAMELEON RF - Comprehensive High-Accuracy Modeling of EL-mg. Effects in cOmplete Nanoscale RF blocks
• FP6/NMP/ARTIC – Nature-inspired micro-fluidic manipulation using artificial cilia (during negotiation)
• FP6/HRM-MC/EST/EST3 - Early Stage Training in an Eastern European Site with Tradition in SCEE (mono-site project)
• CEEX- nEDA - Tools for Nano-Electronics Design Automation (a Romanian national research-training project)
• SCEE06 – Scientific Computation in Electrical Engineering
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Parteneriatul institutional
Parteneriatul European Idustrial:• Philips, IMEC• ST, AMS• Infineon, MAGWEL• CST
Parteneriatul European Academic:noua universitati din Olanda, Germania, Belgia, Italia si Portugalia (dintre care trei din Cluster: TU/e, TUD, IST), dar si doua institute de cercetari
Parteneriatul National:• UPB/CIEAC/LMN• UTCN• INCD Fizica Tehnologica Iasi• IPA Craiova
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Sinergia si complementaritatea proiectelor cu LMN partener
ETASIP
EST3COMSON
CHAMELEON RFExperimentalresults
Experimentalresults
Modelingmethods
4nEDA
nEDAPlatform
nEDAPlatform
EDAtools
EDAtools
ESR
IndustryCEEX researchers
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Resurse umane si mobilitatea cercetatorilor
Research staff at PUB-CIEAC-LMN for nEDA projects:
2 RO researchers (Chameleon - IST)
2 foreign PhD students (Comson RTN)
6 foreign PhD students (EST3) and short stages
4 Romanian PhD students (CEEX)
MAGWEL, Synapto
Philips, ST, Infineon
Philips, ST, Infineon
Academic partners
Academic partners
3rd
E. U.
26 y-pers
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Resursele umane si financiare ale proiectelor
Project STAFF-PUBpersxmnths
staff-totalpersxmnths
PUB(Euro)
Total (Euro)
CODESTAR 30 300 177 000 2 631 594
CHAMELEON 60 341 257 400 2 150 595
COMSON 72 (ESR) 360 167 692 1 650 000
EST3 264 (ESR) 264 587 000 587 000
4nEDA 72 (ER) 72 (ER) 343 068 343 068
SCEE 2 6 57 266 155 200
ETASIP 48 123 457 933 1 172 000
TOTAL 746 1 466 2 047 359 8 689 457
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Obiectivele stiintifice ale cercetarii
Dezvoltarea de noi modele matemetice adecvate si scheme numerice si implementarea lor intr-o platforma software de demonstratie - numita nEDA (“nano Electronic Design Automation”), dedicata problemelor complexe de nanoelectronica.
Platforma nEDA va permite:• simularea cuplata a • dispozitivelor semiconductoare, • interconexiunilor, circuitelor, • campului electromagnetic, si a• efectelor termice, precum si • comparatia intre rezultatele simularii si cele ale masuratiorilor.
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Componentele platformei nEDA
• MOD - Mathematical Modeling and Analysis
• SIM - Simulation Techniques for Coupled Problems
• PDAE - Simulator coupling for systems of Partial Differential-Algebraic Equations
• ROM - Model order reduction for distributed effects
• OPT - Optimization
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Obiectivele tehnologice ale cercetarii
• Rezultatul studiilor: o noua metodologie verificata experimental de extragere automata a modelelor compacte ale nano-blocurilor functionale din RFIC, valabile pana la frecvente de 66 GHz.
• Metodologia va fi implementata prin instrumente software capabile sa genereze automat modele SPICE pornind de la descrierea fizica (layout), luand in considerare efecte care pana in prezent sunt neglijate.
• Cercetarea contribuie la nasterea urmatoarei generatii a tehnologiilor de proiectare nanoelectronica, robuste si eficiente, de verificare a proiectelor si micsorare a timpului si a costului de proiectare.
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Diagrama EDA – etapele proiectarii RFIC
Typical RF IC design flow
Schematic
Simulation
Layout
Physical VerificationDRC, LVS
Signal IntegrityRCx, Lx, EM
Tape outTape out
Optimization
Resimulation
CellLib
Tech-nologyFile
Specification/HDLSpecification/HDL
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Examplu de configuratie tipica AMS SPIRALS.gds benchmark
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Formularea problemeiMain goal: to extract (SPICE) compact electromagnetic model of passive on-chip structures (defined by layout)
Description of field problem (input):• layer geometry (usual Manhattan type) within computational domain Ω (an orthogonal hexahedron) • material constant (σ, ε, μ) in every constitutive brick• boundary conditions (EEC = element of electric circuit type, with voltage or current terminal excitation)
Circuit with R, L, Cand/or
controlled sources
v1
v2
vm
i1
im
The compact model (output):• netlist (topology) and • element constant parameters (R, L, C, α, β)
of an “equivalent” circuit, which has similar terminal behavior (V-I relationship) over the frequency range of interest
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Principiile FIT
Finite Integration Technique (FIT) is a numerical method to solve field problems, based on spatial discretization “without shape functions” using, intensively studied by Th. Weiland et al. since 1977:
• dual staggered orthogonal grids, (Yee type = “complex of
dual Cartesian cells”), suitable for our Manhattan geometry;
• global variables as DOFs: voltages and fluxes on grid elements, and not local field components;
• global form of field equations (neither differential form - FDM, nor weak-variational form - FEM, nor integral equations - BEM/VIE).
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Principiile FIT
• Each mesh cell complies the global field equations • The discretization errors are transferred to constitutive relations
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Maxwell Grid Equations (MGE)
• No discretization errors in MGE fundamental equations• They are metric-free, sparse, mimetic and conservative
DAE, without spurious modes
dt
d
ttdiv
dt
dt
divt
curl
dt
dt
divt
curl
m
qDiJJ
qD
uC'
ρD
DJH
ρD
DJH
D
Cu
B
B
B
BE
)(
0'00
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Operatorii Hodge
• They are metric-dependent and they hold the discretization error.
Classical FIT (MGE+Hodge) must be improved and adapted, in order to achieve the commitments of Codestar project. We did it with ALLROM+VFS.
νm
ε
σ
MuBH
uMED
uMiEJ
describe material behavior:
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
dFIT - dual Finite Integration Technique
• FIT is applied two times, each of the two staggered grids are used as electric and magnetic network, as well;
• The two “dual” solutions provide lower and upper bounds for the exact one;
• The dual approach allows the accuracy control of numerical solution, providing robustness and efficiency of computation. It can be used also to control global or local adaptive mesh refinement process;
• The average of dual solutions is more accurate, it have a higher order convergence.
By dFIT, the number of nodes (and computational effort) required for a given accuracy is drastically reduced !
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Scopul: de la layot (.cif ,.gds) la circuitul echivalent (SPICE)
See www.imec.be/codestar
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
CODESTAR GUI
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Sructura 3D tipica ce va fi modelata
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
Concluzii
Seria de proiecte nEDA contine aspecte novatoare pentru cercetarea romaneasca:
• un domeniu (EDA/nano+info+bio) extrem de actual,
• un caracter multi si inter-disciplinar
• sinergie cu o serie de proiecte europene complementare
• obiective masurabile clare si complexe (subiecte deschise de varf - ENIAC, dotari, dezvoltarea resurselor umane, publicatii internationale, exploatare IPR, FP7)
• parteneriat de elita si beneficiari externi
• UPB – prima institutie host coordonator Marie Curie
© LMN - 2005Workshop Nano – AR - 2 Martie 2006
International Conference on Scientific Computing in Electrical
Engineering SCEE 2006
Sinaia - Romania
17-21 September 2006
www.scee06.org
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